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Industry

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Contact for industry

Emilia Król
phone: +48 12 664 41 38
e-mail: industry.solaris@uj.edu.pl

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Experimental techniques

ARPES (angle-resolved photoemission spectroscopy)

ARPES allows measurements of fundamental quantities, i.e. the energy and the momentum of photoelectrons and through this allows describing the state of electrons in the sample. Due to this information the band structure of solid and surface can be obtained.

ARPES is irreplaceable in investigating:

  • semiconductors
  • materials for solar cells
  • topological insulators
  • high temperature superconductors.

ARPES is available on UARPES and PHELIX beamlines.

PEEM (photoemission electron microscopy)

PEEM uses low energy photoelectrons to provide information about topography, chemical contrast and magnetic domain structure of the examined sample.

PEEM technique can be used in investigation of:

  • metal alloys
  • thin metallic layers
  • magnetic nanostructures
  • catalysts.

PEEM is available on PEEM/XAS beamline.

XAS (X-ray absorption spectroscopy)

XAS provides information about chemical state and local structure of measured material. This technique is widely used in many branches of science.

XAS technique can be used in investigation of:

  • metal alloys
  • topological insulators
  • thin layers of materials.

XAS technique is available on PEEM/XAS and PHELIX beamlines.

XMCD (X-ray magnetic circular dichroism)

XMCD is technique which allows to investigate the magnetic properties of materials.

XMCD technique can be used in investigation of:

  • magnetic layers
  • nanostructures
  • magnetic and electronical structures.

XMCD technique is available on XMCD and PEEM/XAS beamlines.