The PEEM/XAS is a bending magnet based beamline dedicated to microscopy and spectroscopy in the soft X-rays energy range. The beamline is designed to study chemical and electronic, structural and magnetic properties by means of XAS, XNLD (X-ray natural linear dichroism) and XMCD (X-ray magnetic circular dichroism), XMLD (X-ray magnetic linear dichroism), respectively. It is suitable for probing element specific properties of surfaces, interfaces, thin films and nanomaterials. The available photon energy range (200–2000 eV) covers the absorption K edges for light elements, from carbon to silicon, L edges of elements with Z between 20 and 40, including 3d elements, and also M edges of many heavier atoms, including 4f elements.
The offered experimental stations are:
- a photoemission electron microscope (PEEM);
- a universal station for X-ray absorption spectroscopy (XAS).
Both end stations are available for user’s experiments in different sample environments and focusing conditions. Users can apply for beamtime with the PEEM or XAS end station. In order to prepare for their experiment, users are asked to look at the end stations' webpages.
Applications:
the PEEM/XAS beamline can be used in material sciences, physics, chemistry, geosciences and biosciences.
Please do not hesitate to contact the beamline team to discuss if your experiments are technically feasible before submission of the proposal application.
The beamline is co-operated by the Jagiellonian University, the Jerzy Haber Institute of Catalysis and Surface Chemistry of the Polish Academy of Sciences, and the AGH University of Science and Technology in Kraków.
The Jerzy Haber Institute and AGH invite users who have been granted beam time to cooperate:
- an offer of the Jerzy Haber Institute of Catalysis and Surface Chemistry includes carrying out complementary measurements with the Institute's research infrastructure, including LEEM microscope.
- the AGH University of Science and Technology offers a possibility to perform complementary measurements in the laboratories of the Academic Centre for Materials and Nanotechnology, e.g., of resistivity, magnetoresistivity and specific heat at low temperatures (50 mK – 30 K) and at high magnetic fields (up to 14 T) and in the laboratory of the Group of Surface Nanostructures, Faculty of Physics and Applied Computer Science, e.g., of magnetic hysteresis loops by means of magnetooptical Kerr effect.
Beamline parameters:
|
Source |
Bending magnet (1.31 T) |
|
Available (optimal) energy range |
150–2000 eV (300–1600 eV) |
|
Energy resolution ΔE/E |
Not worse than 2.5 x 10-4 |
|
Beam size at sample (H x V) |
At focal point (PEEM): 0.200 mm x 0.050 mm |
|
Photon flux at sample |
109-1010 [ph/s/0.1 A] |
|
Polarization |
Linear (horizontal) and elliptical |
|
End station: photoemission electron microscope |
XPEEM, µ-XAS, µ-XPS, variable sample temperature (100 - 1200 K) |
|
End station: X-ray absorption spectroscopy chamber |
The XAS, XMCD, XMLD for total electron yield (TEY) measurements in applied field (200 mT) and variable sample temperature (20 - 500 K). The partial electron yield detection mode is available for low conductive samples using electron multiplier (channeltron) and from October 2020 fluorescent detector (silicon drift detector type). |