In a photoemission microscope with soft X-rays as an excitation source, XAS, XMCD and XPS spectroscopies are implemented with a lateral resolution of tens of nanometers. In this way, surface imaging with chemical, electronic and magnetic sensitivity is realized.
A preparation chamber, directly attached to the microscope, is as a standard equipped with:
- vacuum load-lock;
- LEED/AES Spectrometer;
- metal (Fe, Co, Au, Ni) and MgO vapour sources controlled with a quartz crystal balance;
- broad beam ion gun (Ar);
- O2 dosing;
- typical single crystalline substrates.
- UHV compatible;
- should not charge under X-ray illumination;
- diameter < 14 mm, height < 3 mm.
- probing depth of a few nanometers;
- image acquisition time from msec to several tens of minutes;
- field of view 5 μm - 150 μm;
- sample temperature 100 K - 1200 K (300 K - 2000 K in preparation chamber);
- maximum imaging pressure ~ 1*10-6 mbar.
The incidence angle of the synchrotron beam is fixed to the 16 degrees. The sample can be rotated over 360 degrees about the axis normal to the sample surface (azimuthal).