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PIRX

The PIRX (Premiere InstRument for Xas) – former PEEM/XAS – is a bending magnet based beamline dedicated to spectroscopy in the soft X-ray energy range. It is suitable for probing element specific properties of surfaces, interfaces, thin films and nanomaterials.

PIRX end station

The beamline is designed to study chemical and electronic, structural and magnetic properties by means of X-ray absorption spectroscopy (XAS), X-ray natural linear dichroism (XNLD) and X-ray magnetic circular dichroism (XMCD), X-ray magnetic linear dichroism (XMLD), respectively. The available photon energy range (100–2000 eV) covers the absorption K edges for light elements, from beryllium to silicon, L edges of elements with Z between 15 and 38, including 3d elements, and also M edges of many heavier atoms, including 4f elements.

The offered experimental station is a universal station for X-ray absorption spectroscopy.

The end station is available for user’s experiments in different sample environments and focusing conditions. When preparing experiment, users are kindly asked to read the information on the website about the experimental station.

Applications

The PIRX beamline can be used in material sciences, physics, chemistry, geosciences and biosciences.

Please do not hesitate to contact the beamline team to discuss if your experiments are technically feasible before submission of the proposal application.

The beamline is co-operated by the Jagiellonian University, the Jerzy Haber Institute of Catalysis and Surface Chemistry of the Polish Academy of Sciences (ICSC PAS), and the AGH University of Science and Technology in Kraków. The relevant agreement was signed on March 2, 2016 (event nformation).

The Jerzy Haber Institute and AGH invite users who have been granted beam time to cooperate: 

Beamline parameters:

Parameters Value

Source

Bending magnet (1.31 T)

Available (optimal) energy range

100–2000 eV (300–1600 eV)

Energy resolution ΔE/E

Not worse than 2.5 x 10-4

Beam size at sample (H x V)

Focused: 250 µm x 40 µm
Defocused: 300 µm x 150 µm

Photon flux at sample

109-1010 [ph/s/0.1 A]

Polarization

Linear (horizontal) and elliptical

End station

PIRX-UHV Soft XAS

Available:

XAS, XNLD, XMCD and XMLD in external magnetic field (140 mT) and variable sample temperature (20-670 K).
Detection modes:
- total electron yield (TEY),
- SDD fluorescent Amptek detector (total (TFY) and  partial (PFY) fluorescence mode),
- transmission using AXUV photodiode. It requires a special holder and sample preparation, which makes it possible for experienced groups after prior consultation with scientists working on the beamline,

 

During implementation (not available):
- the partial electron yield detection mode (PEY) for low conductive samples using MCP (multichannel plates) with retarding voltage.

Video gallery

We invite you to watch the video material below, presenting the research possibilities of the PIRX beamline: