PHELIX beamline

PHELIX is a beamline using soft X-rays, the source of which will be APPLE II undulator with permanent magnets. This type of insertion device gives the opportunity to obtain a variable polarization of light: linear polarization at any angle as well as circular and elliptical polarization. Currently, the PHELIX beamline is at an advanced stage of design.
The PHELIX end-station will enable a wide range of spectroscopic and absorption studies characterized by different surface sensitivity. Besides collecting standard high-resolution spectra, it will allow, e.g. to map the band structure in three dimensions and to detect the spin in three dimensions.
The main components planned for the PHELIX end-station are as follows:
- well-equipped analysis chamber with hemispherical photoelectron energy analyzer with resolution ~1 meV, 3D spin detector VLEED-type, total fluorescence detector and additional sources of radiation (X, UV) enabling operation without a beam,
- preparation chamber with effusion cells and EBVs for in situ thin layers deposition with precise control of their thickness, LEED diffractometer, leak valves enabling operation with various gases and a sample stage allowing samples to be heated up to 2000°C,
- crystal cleaver chamber allowing to expose atomically smooth surfaces under ultra-high vacuum conditions.
Application:
- new materials for spintronics and magnetoelectronics, topological insulators
- thin films and multilayers systems including samples obtained in-situ
- surface of bulk compounds
- surface magnetism, spin polarized surface states
- chemical reactions taking place on the surface
- biomaterials.
The beamline team:
- prof. dr. hab. Jacka Szade, SOLARIS Centre / University of Silesia in Katowice, phone: +48 507 278 072, email: jacek.szade(at)uj.edu.pl
- dr inż. Magdalena Szczepanik-Ciba, SOLARIS Centre, phone: +48 519 307 867; e-mail: magdalena.szczepanik-ciba@uj.edu.pl.
Expected beamline parameters:
Radiation source | elliptically polarizing undulator (EPU), APPLE II type with permanent magnets |
Photon energy range (using the energy of the electrons in the storage ring of 1.5 GeV | 30–1500 eV for horizontal polarization 40–1500 eV for circular polarization 50–1500 eV for vertical polarization 70–1500 eV for linear polarization inclined at 45° |
Maximum resolving power (RP) | > 10 000 |
The maximum size of the excited area on the sample | 100 µm x 100 µm with the resolving power (RP) ≥ 10 000 over the entire energy range and for all polarizations |
Photon flux on the sample | ≥ 1×1013 photons/s/0.1% B.W. for 50 eV and ≥ 1×1011 photons/s/0.1% B.W. for 1500 eV, for maximum RP and electron current in the storage ring (500 mA) |
Controlled polarization | variable linear, circular and elliptical |
Available techniques | PES (ResPES, ARPES, SX-ARPES, SR-ARPES, XPS, UPS, CD-ARPES), XAS (TFY, TEY) |