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DEMETER beamline is specialized research installation using variable polarization radiation, the source of which is the EPU undulator (elliptically polarizing undulator).

The concept of the beamline DEMETER (Dual Microscopy and Electron Spectroscopy Beamline) assumes the coexistence of two measurement branches, in which the research end-stations is the PEEM microscope (photoemission electron microscope) and STXM (scanning transmission X-ray microscope).  

The PEEM end-station with standard equipment will allow for the creation and modification of research systems and imaging of their surfaces in a wide range of temperatures and with high resolution. The main advantage of the method is the ability to select the energy of excitations and the possibility of tuning to the characteristic edge of the absorption. 

The parent institution for the PEEM end station is the Jerzy Haber Institute of Catalysis and Surface Chemistry of the Polish Academy of Sciences (ICSC PAS). Thanks to the collaboration of SOLARIS with the Jerzy Haber Institute of Catalysis and Surface Chemistry of the Polish Academy of Sciences and the AGH University of Science and Technology in Kraków (AGH-UST) on March 2, 2016, an appropriate agreement was signed (event information) under which the PEEM end station is made available to Users in the synchrotron facility. As part of the cooperation, the infrastructure for the end station is maintained and developed, and the support of the microscope operators during the measurements is provided. 

The STXM end-station will provide chemical analysis at the nanoscale through the combination of X-ray absorption spectrometry and microscopy. 

Potential application of the beamline:

  • Magnetic order research 
  • Domain structure research 
  • Imaging of the chemical composition 
  • Biomolecular spectroscopy 
  • Fluorescence detection. 

The ICSC PAS and AGH-UST invite users who have been granted beam time to cooperate: 

Beamline parameters

Parameters Value
Source EPU (undulator) 
Available energy range  100–2000 eV (horizontal polarization)
Energy resolution ΔE/E 6 - 30 x 10-5
Beam size at sample (H x V)  PEEM: 200 (h) x 40 (v) μm2
STXM: diameter 30 nm (min) – 300 μm (max)
Photon flux at sample ~1012 ph/s/0,1% bw
Polarization circular left- and right-handed, elliptical, linear horizontal and vertical 
End stations PEEM, STXM
End station

Microspot diffraction and spectroscopy techniques: μ-XAS, μ-LEED 

During implementation (not available):

End station

- imaging in transmission: multiplier tube (PMT) and avalanche photodiode (APD) detection


Available at expert mode:
- Silicon drift detector (SDD) - Amptek X123 Fast SSD detector with sensitivity for photons with energy above about 200 eV
- electrochemical cell system (for liquids and gases)


During implementation (not available):
- measurements using a controlled external magnetic field
- ability to control the measurement geometry (angle of incidence)
- electrochemical cell system for suspensions or solids
- environmental cell system with heating option (RT-475 K)