PHELIX is a beamline operating in the soft X-ray range, the source of which is an elliptically polarizing undulator. Owing to the use of such a source, the beamline produces both linear and circular or elliptical polarizations of high intensity light. The light parameters of the PHELIX beamline and the equipment available at the end-station allow for spectroscopic measurements of photoelectrons and absorption in ultra-high vacuum conditions.
The available energy range of radiation (50 - 1500 eV) is suitable for research on many materials used e.g. in modern electronic devices, modern catalysts or fuel cells. The end-station enables measurements of Resonant Photoemission (Res-PES), Circular Dichroism (CD), X-ray Absorption Spectroscopy (XAS) in the Total Fluorescence Yield (TFY) mode and measurement of the sample current (Total Electron Yield - TEY). However, what makes the end-station unique is the ability to map the band structure in three dimensional k space using the Soft X-ray Angle Resolved Photoelectron Spectroscopy (SX-ARPES) and obtaining direct information about the spin texture using the 3D spin detector integrated with a photoelectron spectrometer (Spin Resolved Angle Resolved Photoelectron Spectroscopy - SR-ARPES).
|Source||Elliptically polarizing undulator EPU APPLE II type|
|Available energy range||
40–1500 eV for horizontal polarization
|Energy resolution ΔE/E||10 000|
|Beam size at sample (H x V)||30x80 µm2 @ 50 eV
10x60 µm2 @ 1500 eV
|Photon flux at sample||8.2×1012 ph/s @ 50 eV
1.4×1012 ph/s @ 1500 eV
RP = 10 000, electron, current = 500 mA
|Polarization||Linear (horizontal, vertical), circular, elliptical|