XPS/XAS endstation will focus on characterizing wide variety of materials via X-ray spectroscopy techniques. For example, µ-XPS will enable high resolution studies of electronic structure of surfaces and interfaces. Alternatively, µ-XAS and µ-XRF techniques will be applied to perform chemical characterizations and mapping of the sample. XPS/XAS ensdstation will find application in nanoelectronics, quantum materials, solar cells, energy storage, catalysis, nano-biomedicine, etc.

AP-HAXPES endstation will utilize hard X-ray energy range of the beamline to perform studies of interfaces with improved depth sensitivity. Experiments performed at ambient pressure will allow for investigation of processes on solid–liquid and solid-gas interfaces. Additionally, „dip and pull” and liquid jet modules will enable in-situ/operando studies of the electrochemical processes. Applications of the AP-HAXPES endstation span wide range of areas, e.g. catalysis, electrochemistry, biology, materials engineering, electronics etc.