Contact for industry
Dr. Mikołaj Gołuński
Industry Liaison Officer
phone: +48 12 664 41 93; +48 506 006 774
e-mail: industry.solaris@uj.edu.pl; mikolaj.golunski@uj.edu.pl
Dr. Mikołaj Gołuński
Industry Liaison Officer
phone: +48 12 664 41 93; +48 506 006 774
e-mail: industry.solaris@uj.edu.pl; mikolaj.golunski@uj.edu.pl
The method is based on the absorption of X-ray photons by the studied materials. When the energy of the incident photons approaches the excitation energy of electrons in certain atoms (absorption edge), the absorption coefficient rises significantly. This energy is characteristic for a given element and electronic shell, therefore the method can be used to study the chemical composition of the complex compounds. Thanks to the subtle variation of the absorption coefficient near the absorption edge, which can be probed by varying the energy of the incoming X-ray radiation, chemical properties (such as oxidation state) and local geometric arrangement of the atoms surrounding probed element (distance to the nearest neighbors and their number) can be studied.
Depending on the choice of a detection method, signal can be collected either from the surface of the samples (depth up to a few nanometers, in case of the total electron yield detection), or from the bulk (depth from a few hundred nanometers, when using soft X-ray radiation up to a few hundred micrometers, when using hard X-ray radiation, in case of the fluorescence or transmission detection). It is also possible to study time-dependent change in the adsorption coefficient of the studied materials.
XAS method can be used in the following industrial sectors:
XAS method is available on the following beamlines: ASTRA, DEMETER, PHELIX, PIRX. The basic parameters of the experimental stations and restrictions with regard to sample type are shown in table.
|
Beamlines |
Type of samples |
Photon energy range |
|---|---|---|
|
UHV-compatible solids only |
100 – 2000 eV |
|
|
UHV-compatible solids only |
30 – 1500 eV |
|
|
no requirements: solids, liquids, gases |
1 – 15 keV |