The method is based on the difference of the absorption coefficient of X-ray photons with left- or right- handed polarization (in case of X-ray circular magnetic dichroism: XMCD), or orthogonal polarization (in case of X-ray linear dichroism: XMLD), and provides information about the magnetic properties of studied materials. Because of the possibility of measuring photon absorption near specific absorption edges, the method is chemically sensitive and complementary to X-ray absorption spectroscopy. In combination with photoelectron emission microscopy (PEEM), it allows for the microscopic studies of magnetic ordering in various materials and the determination of the magnetization direction of ferromagnetic domains.

Experiments can be performed with surface sensitivity (in the imaging mode, depth of up to a few nm), or for the bulk samples.

XMD method can be used in the following industries:

• steel industry (determination of the distribution of iron atoms in the spinel groups, studies of permanent magnets)
• magnetic memories (characterization of thin magnetic films and determination of their temperature stability)
• catalysis (magnetic nanoparticles, compounds containing iron or transition metal atoms) biotechnology (metal atoms in enzymes and other biomolecules, crystallization methods of magnetic materials utilizing bacteria)
• spintronics (characterization of low-dimensional magnetic elements and devices, such as magnetic random access memories).

XMD method is available at the PIRX beamline. Available photon energies are in the range between 100eV and 2000eV. Samples can be placed in a magnetic field with the maximum induction of 200mT. Only UHV-compatible solids can be studied at this experimental station. It is possible to image the samples with chemical sensitivity and with spatial resolution of around 10nm. The temperature of samples can be varied from -250°C to +400ºC, which enables studies of magnetic phase transformations.